Full field displacement measurement and data processing of 3D components of mechatronic systems

D. Rubliauskas; R. Palevicius; V. Ostasevicius; M. Ragulskis; A. Palevicius

doi:10.1117/12.629746

7 November 2005 Full field displacement measurement and data processing of 3D components of mechatronic systems

D. Rubliauskas, R. Palevicius, V. Ostasevicius, M. Ragulskis, A. Palevicius

Proceedings Volume 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III; 60000P (2005) https://doi.org/10.1117/12.629746
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

Holographic measurement techniques based on optical interferometry theory are widely applied in such areas as mechanics, electronics, computer industry, etc. One of limitation of practical method application is complicated interpretation of holographic interferograms because quantitive analysis is directly related with properties of the analyzed object and with structure of experiment itself. The optical measurement (holographic interferometry) data processing system is presented for identification of characteristics of dynamic of 3D components of mechatronic construction. The system uses optical view and mathematical model of experiment as input data producing the qualitative description of analyzed mechatronic system. Mathematical model of the experiment is built using the geometry of the measurement, elasticity theory and finite element method. The proposed method for identification of the properties of the analysed system has important advantages over other similar digital hologram interpretation schemes as the applied calculation principle is based on the natural eigenmodes of the analysed system. Such approach enables to decrease the volume of calculations without losing accuracy.

Citation Download Citation

D. Rubliauskas, R. Palevicius, V. Ostasevicius, M. Ragulskis, and A. Palevicius "Full field displacement measurement and data processing of 3D components of mechatronic systems", Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000P (7 November 2005); https://doi.org/10.1117/12.629746

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Holograms

Holography

Data processing

Digital holography

Mathematical modeling

Mechatronics

3D metrology

Show All Keywords

Keywords/Phrases

Search In:

Publication Years