Paper
3 May 2006 Estimating the refractive index and reflected zenith angle of a target using multiple polarization measurements
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Abstract
A passive polarization based imaging system records the polarization state of light reflected by objects that are illuminated with an unpolarized and generally uncontrolled source. The information conveyed by the polarization state of light has been exploited in applications such as target detection, shape extraction and material classification. In this paper we present a method to jointly estimate the refractive index and the reflected zenith angle from two measurements collected by a passive polarimeter. An expression for the degree of polarization is derived from the microfacet polarimetric bidirectional reflectance model for the case of scattering in the place of incidence. The parameters of interest are iteratively estimated from polarization measurements assumed to be collected with a polarimeter. Computer simulations are presented to demonstrate the effectiveness of the proposed method.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vimal Thilak, David Voelz, Charles Creusere, and Srikanth Damarla "Estimating the refractive index and reflected zenith angle of a target using multiple polarization measurements", Proc. SPIE 6240, Polarization: Measurement, Analysis, and Remote Sensing VII, 624004 (3 May 2006); https://doi.org/10.1117/12.666183
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Cited by 2 scholarly publications.
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KEYWORDS
Refractive index

Polarimetry

Polarization

Scattering

Bidirectional reflectance transmission function

Dielectric polarization

Reflectivity

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