Paper
15 September 2006 Real time phase stepping pattern projection profilometry
Ventseslav Sainov, Elena Stoykova, Jana Harizanova
Author Affiliations +
Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 63410P (2006) https://doi.org/10.1117/12.695296
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
A single-shot fringe projection profilometry system based on simultaneous projection of four phase-shifted sinusoidal fringe patterns generated at four different wavelengths is described. The system includes a fringe pattern generation module containing four blocks with four near-infrared diode lasers and a registration module with four CCD cameras. In order to simplify the technical solution and to avoid the stringent requirement for stability in the case of interferometric fringe generation, we study both theoretically and experimentally realization of the proposed system by using of a phase grating as well as a holographic optical element for reconstruction of two point sources. The results of the measurement of the relative and absolute coordinates of test objects for both types of diffraction gratings are presented.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ventseslav Sainov, Elena Stoykova, and Jana Harizanova "Real time phase stepping pattern projection profilometry", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63410P (15 September 2006); https://doi.org/10.1117/12.695296
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CITATIONS
Cited by 4 scholarly publications and 9 patents.
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KEYWORDS
Fringe analysis

Diffraction gratings

Holography

CCD cameras

Semiconductor lasers

Phase shift keying

3D metrology

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