Paper
12 October 2006 Beam intensity measurement system for proton synchrotron booster
David Belohrad, Grzegorz Kasprowicz
Author Affiliations +
Proceedings Volume 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006; 63470F (2006) https://doi.org/10.1117/12.714530
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 2006, Wilga, Poland
Abstract
The PS Booster delivers particles for most of the CERN experiments. The PS complex will become particle source for LHC in 2007. For this reason PS complex electronics is continuously upgraded to meet new requirements in performance and remote management. A new acquisition system has been developed to allow the measurement of the individual intensity of each bunch in a 1Hz bunch train. Such a system will be used for the measurement of beams at the injection, ejection and acceleration lines . The method is based on integrating of the analogue signal supplied by a Beam Current Transformer. The signal is sampled by two 12 bits ADCs with 20x oversampling. The output of ADC is then processed in FPGA, where the rest of the signal processing is performed. The measurement system was build as a standard VME module. Apart from that, on same board there were implemented current and charge calibrators.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Belohrad and Grzegorz Kasprowicz "Beam intensity measurement system for proton synchrotron booster", Proc. SPIE 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 63470F (12 October 2006); https://doi.org/10.1117/12.714530
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration

Field programmable gate arrays

Picosecond phenomena

Optical testing

Transformers

Signal processing

Capacitors

Back to Top