Research on portable maintenance aid equipment using ARM-based VXI modules

Hu Bao; ChaoLong Ying; QingWei Shi; JianFu Teng

doi:10.1117/12.718027

30 October 2006 Research on portable maintenance aid equipment using ARM-based VXI modules

Hu Bao, ChaoLong Ying, QingWei Shi, JianFu Teng

Proceedings Volume 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation; 63582B (2006) https://doi.org/10.1117/12.718027
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

In a large-scale warship electronic equipment ATE, the main testing system is designed as an intermediate-level test system, which will perform automatic test and fault localization up to SRUs level. UUTs of the system are faulty LRUs. Different from small-scale aircraft avionics, Built-In Test (BIT) in current warships electronic equipments might arise too much ambiguous fault isolation and could not detect the failure of cables, which results in high false removal rates and causes a lot of manpower and resources waste. The situation will be worse when the deployment of main testing system is usually confined to the site. In this paper, we aim at developing a kind of Portable Maintenance Aid Equipment (PMAE) based on VXI bus technology in order to overcome above restrictions where 0-slot controller as well as some dedicated test modules are designed using ARM based embedded system. The PMAE could cooperate with the main testing system in realizing remote measurement and control through virtual instrument (VI) technology, thus the localization veracity of faulty LRUs and cables could be greatly improved. Test results indicated good performance of this scheme, thereby greatly augmenting diagnostic capacity and efficiency of the large-scale warships ATE.

Citation Download Citation

Hu Bao, ChaoLong Ying, QingWei Shi, and JianFu Teng "Research on portable maintenance aid equipment using ARM-based VXI modules", Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 63582B (30 October 2006); https://doi.org/10.1117/12.718027

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