Direct Contact Profilometry Of Large Aspherics

Lance D. Lund

doi:10.1117/12.964489

3 November 1986 Direct Contact Profilometry Of Large Aspherics

Lance D. Lund

Proceedings Volume 0645, Optical Manufacturing, Testing and Aspheric Optics; (1986) https://doi.org/10.1117/12.964489
Event: 1986 Technical Symposium Southeast, 1986, Orlando, United States

Abstract

A commercial coordinate measuring machine has been modified to provide surface profile measurements of one meter optics to an accuracy of 50 microinches. Additional calibration of specific surfaces provides an accuracy of 15 microinches. Data acquisition and analysis software is discussed.

Citation Download Citation

Lance D. Lund "Direct Contact Profilometry Of Large Aspherics", Proc. SPIE 0645, Optical Manufacturing, Testing and Aspheric Optics, (3 November 1986); https://doi.org/10.1117/12.964489

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