Paper
29 January 2007 Contribution to quality assessment of digital halftoning algorithms
Ferruccio Cittadini, Michaël Remita, Jacques Pervillé, Stéphane Berche, Mohamed Ben Chouikha, Hans Brettel, Georges Alquié
Author Affiliations +
Proceedings Volume 6493, Color Imaging XII: Processing, Hardcopy, and Applications; 64931D (2007) https://doi.org/10.1117/12.704195
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States
Abstract
Many new proposals are continually published in the halftoning domain. Alas, the demonstration of the interest of the proposed methods is often limited to a few favourable tests for the proposed methods, and images showing the defects of the other halftoning methods. The halftoning community needs to be able to compare a halftoning method with the innovations that appear in this domain. A complete and measured evaluation of quality is necessary through to a well defined set of test images and metrics to evaluate the algorithm. This paper proposes a protocol for the quality assessment of digital halftoning algorithm that can be used to compare one algorithm to another. It discusses the assessment of halftoner quality. It analyzes the perceived image quality concepts and defines the technical criteria that a good halftoner must match. A first sketch of a simple quality assessment protocol is proposed. It is composed of test images and quality metrics. This protocol could be used to provide new proposed halftoning algorithms with objective results.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ferruccio Cittadini, Michaël Remita, Jacques Pervillé, Stéphane Berche, Mohamed Ben Chouikha, Hans Brettel, and Georges Alquié "Contribution to quality assessment of digital halftoning algorithms", Proc. SPIE 6493, Color Imaging XII: Processing, Hardcopy, and Applications, 64931D (29 January 2007); https://doi.org/10.1117/12.704195
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Cited by 1 scholarly publication.
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KEYWORDS
Image quality

Image processing

Diffusion

Stochastic processes

Optical lithography

Visualization

Anisotropy

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