New geometry for planar UV written refractive index sensors

James C. Gates; Christopher H. Holmes; F. Rafiq M. Adikan; Corin B. E. Gawith; Peter G. R. Smith

doi:10.1117/12.722871

16 May 2007 New geometry for planar UV written refractive index sensors

James C. Gates, Christopher H. Holmes, F. Rafiq M. Adikan, Corin B. E. Gawith, Peter G. R. Smith

Proceedings Volume 6585, Optical Sensing Technology and Applications; 65850O (2007) https://doi.org/10.1117/12.722871
Event: International Congress on Optics and Optoelectronics, 2007, Prague, Czech Republic

Abstract

UV written planar waveguide sensors provide an integrated solution to refractive index sensors. The high sensitivity of the devices originate from their use of Bragg gratings which provide an accurate means of interrogating the local effective index. Conventionally the optical mode is made sensitive to an external refractive index by etching away the cladding and exposing it to an analyte. These devices have been used to sense liquid/solid phase changes and have displayed their potential for use as biological and chemical sensors. Recent results demonstrate sensitivities rivaling that of the highest specification Surface Plasmon Resonance (SPR) techniques. Here we introduce a new geometry which embraces the benefits of planar technology to realise new integrated devices. The geometry relies upon the use of a vertical trench or groove to produce an interface of optical quality which provides lateral access for an optical mode. The evanescent field interacts with the material within the groove and a Bragg grating in the region provides the means for interrogation. This reorientation of the sensor geometry provides additional flexibility to UV written devices, allowing several different sensors to be defined on the single substrate without multiple etching processes. These multiple sensors may offer complementary information such as the effective index as a function of penetration depth and interrogation wavelength for dispersion analysis. The paper also outlines the inherent feature benefits and fabrication advantages, including a reduction in return loss, spectral artefacts and stress induced birefringence.

Citation Download Citation

James C. Gates, Christopher H. Holmes, F. Rafiq M. Adikan, Corin B. E. Gawith, and Peter G. R. Smith "New geometry for planar UV written refractive index sensors", Proc. SPIE 6585, Optical Sensing Technology and Applications, 65850O (16 May 2007); https://doi.org/10.1117/12.722871

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available