Simultaneous Laser Beam Profiling And Scaling Using Diffraction Edge Waves (DEW)

Pierre Langlois; Roger A. Lessard

doi:10.1117/12.938632

25 November 1986 Simultaneous Laser Beam Profiling And Scaling Using Diffraction Edge Waves (DEW)

Pierre Langlois, Roger A. Lessard

Proceedings Volume 0661, Optical Testing and Metrology; (1986) https://doi.org/10.1117/12.938632
Event: 1986 Quebec Symposium, 1986, Quebec City, Canada

Abstract

A simple method of laser beam profiling using a scanning knife-edge is presented. Instead of monitoring the nonobstructed part of the beam as is usually done, the photo-detector is placed completely outside the beam and measures the light intensity of the DEW. Thus the spatial profile of very small Gaussian beams is obtained directly on an oscilloscope without any inversion procedure. By using the DEW emitted by another beam focused through a grating it is also possible to get a spatial calibration scale.

Citation Download Citation

Pierre Langlois and Roger A. Lessard "Simultaneous Laser Beam Profiling And Scaling Using Diffraction Edge Waves (DEW)", Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); https://doi.org/10.1117/12.938632

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available