An integrated measurement system for LED thermal, optical and electrical characteristics

Xiyong Zou; Xiaoming Zheng; Shangzhong Jin; Kai Ni; Huaming Zhou; Xianqi He

doi:10.1117/12.791178

12 March 2008 An integrated measurement system for LED thermal, optical and electrical characteristics

Xiyong Zou, Xiaoming Zheng, Shangzhong Jin, Kai Ni, Huaming Zhou, Xianqi He

Proceedings Volume 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing; 66241Q (2008) https://doi.org/10.1117/12.791178
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China

Abstract

Thermal, optical and electrical parameters are main characterization of light-emitting diodes (LEDs). Consumers are often concerned about the explicit properties such as luminous intensity, luminous flux and color. But Manufacturers may pay more attention to the thermal characteristic. Excess heat at the junction directly affects the LED performance in terms of color shit, light output and life. To measure all these parameters of LED accurately and simultaneously, we designed an integrated system, product number SSP8112, which was based on a new developed thermal, optical and electrical measurement instrument and a specially-made integrating sphere with temperature controller. The thermal measurement segment of the instrument was developed in accordance with JESD51-1 standard; it can automatically record the transient response curve of heat with a 50μs time resolution and a 0.5mV voltage resolution. And the integrating sphere, which has high light reflectivity, good thermal insulation and tolerance to high temperature, was used to achieve the optical response during the experiment. The principle and structure of this system were introduced and discussed, and at the end an application example was presented.

Citation Download Citation

Xiyong Zou, Xiaoming Zheng, Shangzhong Jin, Kai Ni, Huaming Zhou, and Xianqi He "An integrated measurement system for LED thermal, optical and electrical characteristics", Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241Q (12 March 2008); https://doi.org/10.1117/12.791178

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available