Dynamic displacement measurement of Low-E membrane reactor by PSD based on laser-triangulation method

Baoqiang Li; Tiegen Liu; Yao Zhang

doi:10.1117/12.757287

24 January 2008 Dynamic displacement measurement of Low-E membrane reactor by PSD based on laser-triangulation method

Baoqiang Li, Tiegen Liu, Yao Zhang

Proceedings Volume 6829, Advanced Materials and Devices for Sensing and Imaging III; 68291N (2008) https://doi.org/10.1117/12.757287
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

During the production of Low-E (Low-Emission) glass, the distance between Low-E membrane reactor and the float glass impacts the thickness of Low-E membrane coated, and the quality of products. The system, designed to measure the displacement of the reactor, which represents the distance between Low-E membrane reactor and the float glass, will work in the industrial condition of high temperature and strong interference. On the consideration of non-contact, noninvasive and high-speed, a measure system by PSD (Position Sensitive Detector) based on Laser-Triangulation method is designed and a prototype made. In this system, a laser beam, generated by a semiconductor laser generator, focuses on the underside surface of the Low-E membrane reactor made of graphite. And then, the laser spot on the underside surface, through a small focus lens, is detected by a 1D-PSD (One-Dimension Detector). The electric signal, reflecting the position of the small laser spot on the PSD, is amplified and processed by amplifier and signal processing circuit, then is sampled by a A/D converter. Based on the Laser-Triangulation method, the displacement can be computed. Trial shows, the system based on Laser-Triangulation method meets the requirements of high-speed, noninvasive, non-contact, and to some extent diminishes the influence of nonlinearity and dark current of the PSD.

Citation Download Citation

Baoqiang Li, Tiegen Liu, and Yao Zhang "Dynamic displacement measurement of Low-E membrane reactor by PSD based on laser-triangulation method", Proc. SPIE 6829, Advanced Materials and Devices for Sensing and Imaging III, 68291N (24 January 2008); https://doi.org/10.1117/12.757287

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