Paper
22 April 2008 Shack-Hartmann wavefront sensor for the determination of local inhomogeneities of the surface
Andrey A. Goloborodko, Vitalij N. Kurashov, Dmytro V. Podanchuk, Natalia S. Sutyagina
Author Affiliations +
Proceedings Volume 7008, Eighth International Conference on Correlation Optics; 70081S (2008) https://doi.org/10.1117/12.797117
Event: Eighth International Conference on Correlation Optics, 2007, Chernivsti, Ukraine
Abstract
The modification of the wavefront registration scheme for the purpose of the sensor spatial resolution improvement is considered. It's proposed to use the focused laser beam for illumination of the separate area of the surface, which after the optical transformation in Fourier optics scheme forms the signal in the sensors plane that is proportional to the spectrum of the spatial frequencies of the surface shape. At the same time the spatial resolution in the surface plane is determined by the sensor aperture, but not the spatial resolution of its lenslet array. The theoretical analysis and computer simulation of the wavefront sensor work for the local inhomogeneities determination of thereflective surface is realized. For obtaining the submicron spatial resolution of the sensor it is proposed to classify the surface micro areas by the multidimensional statistical analysis methods.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrey A. Goloborodko, Vitalij N. Kurashov, Dmytro V. Podanchuk, and Natalia S. Sutyagina "Shack-Hartmann wavefront sensor for the determination of local inhomogeneities of the surface", Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70081S (22 April 2008); https://doi.org/10.1117/12.797117
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Cited by 4 scholarly publications.
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KEYWORDS
Wavefronts

Wavefront sensors

Spatial resolution

Sensors

Statistical analysis

Spatial frequencies

Fourier optics

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