Paper
31 December 2008 Measuring straightness error of guide with modulated polarized light
Ling-Jian Zhu, Lin Li, Jun-Hua Liu, Zhong-Hua Zhang
Author Affiliations +
Proceedings Volume 7130, Fourth International Symposium on Precision Mechanical Measurements; 713048 (2008) https://doi.org/10.1117/12.819712
Event: Fourth International Symposium on Precision Mechanical Measurements, 2008, Anhui, China
Abstract
This paper presents a new method of measuring guide straightness error based on a linear relationship between polarized angle and lateral offset position displacement. A peculiar polarized beam, whose polarization angles are distributed linearly as lateral direction coordinates, is modulated by a designed active optical modulator based on polarization interference principle. The polarization angles of the beam are detected by an optical detecting component and an optical slit, which move correspondingly with the existed guide straightness error. Experiments are conducted to validate the method and the results show that the correlation coefficients R2 of the linear fitting curves between the polarized angle and offset displacement is above 0.9996 with the standard deviation of the repeatability within 1μm, which coincides with the theoretical analysis. The range of measuring straightness error is above 0.5mm with the resolution level at submicron grade. This method minimizes the effects caused by the variation of light intensity and possesses the advantages of convenience, high reliability and accuracy. It is able to be applied in the actual industrial applications.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ling-Jian Zhu, Lin Li, Jun-Hua Liu, and Zhong-Hua Zhang "Measuring straightness error of guide with modulated polarized light", Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 713048 (31 December 2008); https://doi.org/10.1117/12.819712
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KEYWORDS
Polarization

Modulation

Beam splitters

Modulators

Sensors

Time metrology

Error analysis

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