Wideband dectection of spontaneous Brillouin scattering spectrum in Brillouin optical time-domain reflectometry

Yuangang Lu; Rongrong Dou; Xuping Zhang

doi:10.1117/12.807012

9 February 2009 Wideband dectection of spontaneous Brillouin scattering spectrum in Brillouin optical time-domain reflectometry

Yuangang Lu, Rongrong Dou, Xuping Zhang

Author Affiliations +

Proceedings Volume 7158, 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration; 715818 (2009) https://doi.org/10.1117/12.807012
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

Brillouin Optical Time-Domain Reflectometry (BOTDR) is attracting significant attention due to its immense potential applications in temperature or strain monitoring. Conventional BOTDR system based on Spontaneous Brillouin Scattering Spectrum(SBSS) narrow-band detection is not only time-consuming but also controlling complicated. To overcome the drawbacks of the conventional detection method, a new SBSS wideband detection method is proposed in this paper. In the new detection method, the whole SBSS is captured by use of a wideband receiver in a single measurement, and Discrete Fourier Transform (DFT) signal processing algorithm is used to obtain the SBSS. The configuration of a heterodyne detection BOTDR system based on SBSS wideband detection is presented, and the data processing method, the spatial resolution of the system and the measurement time is discussed. The BOTDR system based on SBSS wideband detection has been demonstrated, and a temperature resolution of 3°C and a spatial resolution of 2 m have been achieved. The measurement time is only about one-tenth that of conventional narrow-band detection method.

Citation Download Citation

Yuangang Lu, Rongrong Dou, and Xuping Zhang "Wideband dectection of spontaneous Brillouin scattering spectrum in Brillouin optical time-domain reflectometry", Proc. SPIE 7158, 2008 International Conference on Optical Instruments and Technology: Microelectronic and Optoelectronic Devices and Integration, 715818 (9 February 2009); https://doi.org/10.1117/12.807012

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available