Characterization of sensing layer onto the tip tapered fiber

M. Pospisilova; J. Petrasek; V. Matejec; I. Kasik

doi:10.1117/12.820973

18 May 2009 Characterization of sensing layer onto the tip tapered fiber

M. Pospisilova, J. Petrasek, V. Matejec, I. Kasik

Proceedings Volume 7356, Optical Sensors 2009; 735624 (2009) https://doi.org/10.1117/12.820973
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic

Abstract

In this paper we present a novel method for the measurement of the thickness of the sensing layer applied on the tip of an optical fiber and fiber tapers. The method is based on analysis of distributions of the fluorescence intensity over this layer. In experiments the fluorescence of the sensing layer prepared by the sol-gel method was investigated be means of a confocal microscope Zeiss LS5 Duo. The fluorescence was excited at 477 nm by an Ar laser and detected in a spectral range from 518 to 600 nm. The fluorescence distribution was determined by scanning the layer in the direction of the taper axis (z-direction) with a step of 500 nm in an overall length of 42 μm and 26 μm. The layer thickness was estimated from the measured distribution of fluorescence intensity. Assumptions of method are that close to the layer boundary the fluorescence intensity decreases with z², the concentration of fluorescence centers in the layer is homogenous and attenuation of excitation wavelength in the sensing layer is neglected. This method has made possible to investigate sensing layers with thicknesses of about 1 μm.

Citation Download Citation

M. Pospisilova, J. Petrasek, V. Matejec, and I. Kasik "Characterization of sensing layer onto the tip tapered fiber", Proc. SPIE 7356, Optical Sensors 2009, 735624 (18 May 2009); https://doi.org/10.1117/12.820973

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