Dual-CGH interferometry test for x-ray mirror mandrels

Guangjun Gao; John P. Lehan; Ulf Griesmann

doi:10.1117/12.830659

17 June 2009 Dual-CGH interferometry test for x-ray mirror mandrels

Guangjun Gao, John P. Lehan, Ulf Griesmann

Proceedings Volume 7389, Optical Measurement Systems for Industrial Inspection VI; 73891B (2009) https://doi.org/10.1117/12.830659
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany

Abstract

We describe a glancing-incidence interferometric double-pass test, based on a pair of computer-generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are described. The application illustrates the advantage of dual-CGH tests for the complete metrology of precise optical surfaces.

Citation Download Citation

Guangjun Gao, John P. Lehan, and Ulf Griesmann "Dual-CGH interferometry test for x-ray mirror mandrels", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891B (17 June 2009); https://doi.org/10.1117/12.830659

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