Paper
31 December 2009 Imaging system to measure kinetics of material cluster ejection during exit-surface damage initiation and growth in fused silica
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Abstract
Laser-induced damage on the surface of optical components typically is manifested by the formation of microscopic craters that can ultimately degrade the optics performance characteristics. It is believed that the damage process is the result of the material exposure to high temperatures and pressures within a volume on the order of several cubic microns located just below the surface. The response of the material following initial localized energy deposition by the laser pulse, including the timeline of events and the individual processes involved during this timeline, is still largely unknown. In this work we introduce a time-resolved microscope system designed to enable a detailed investigation of the sequence of dynamic events involved during surface damage. To best capture individual aspects of the damage timeline, this system is employed in multiple imaging configurations (such as multi-view image acquisition at a single time point and multi-image acquisition at different time points of the same event) and offers sensitivity to phenomena at very early delay times. The capabilities of this system are demonstrated with preliminary results from the study of exitsurface damage in fused silica. The time-resolved images provide information on the material response immediately following laser energy deposition, the processes later involved during crater formation or growth, the material ejecta kinetics, and overall material motion and transformation. Such results offer insight into the mechanisms governing damage initiation and growth in the optical components of ICF class laser systems.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rajesh N. Raman, Raluca A. Negres, and Stavros G. Demos "Imaging system to measure kinetics of material cluster ejection during exit-surface damage initiation and growth in fused silica", Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 750418 (31 December 2009); https://doi.org/10.1117/12.836922
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Cited by 2 scholarly publications.
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KEYWORDS
Particles

Imaging systems

Microscopes

Image processing

Polarization

Silica

Backscatter

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