Research of full-field deformation measurement system

Kaiduan Yue; Mei Yuan; Yaxing Yi; Zhongke Li; Fei Zhang; Longfei Jian

doi:10.1117/12.837776

20 November 2009 Research of full-field deformation measurement system

Kaiduan Yue, Mei Yuan, Yaxing Yi, Zhongke Li, Fei Zhang, Longfei Jian

Proceedings Volume 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 75110I (2009) https://doi.org/10.1117/12.837776
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

It is very important to measure the vibration amplitude and the dynamic deformation of the object so Electrical Speckle Pattern Interferometry technique has developed rapidly in recent years because of its Non Destructive Testing (NDT) methodology. A dynamic Electrical Speckle Pattern Interferometry technique was described in the paper. The Spatial Phase-shift System was implemented through four CCD cameras. The object light interferes with the given phase shifting value of reference light at the baget of each CCD camera. The vibration amplitude and the dynamic deformation can be measured by the phase detecting method. The error of the influence of the disturbance of the air, the influence of the changing temperature, and the influence of the vibration of the environment can be eliminated. The image matching and image emendation technology were used for the images of four CCDs to optimize the result of the measurement. The Space Phase-shift System was promoted by the transient vibration and dynamic deformation system.

Citation Download Citation

Kaiduan Yue, Mei Yuan, Yaxing Yi, Zhongke Li, Fei Zhang, and Longfei Jian "Research of full-field deformation measurement system", Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110I (20 November 2009); https://doi.org/10.1117/12.837776

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KEYWORDS

CCD cameras

Speckle pattern

Interferometry

Phase measurement

Cameras

Image processing

Charge-coupled devices

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