Experimental studies of PCS system for measuring of nanometer particles

Shao-yong Deng; Qi Zhang

doi:10.1117/12.837569

20 November 2009 Experimental studies of PCS system for measuring of nanometer particles

Shao-yong Deng, Qi Zhang

Proceedings Volume 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 751111 (2009) https://doi.org/10.1117/12.837569
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

A series of dynamic light scattering (DLS) experimental systems basing on photon correlation spectroscopy (PCS) are brought forth for measuring the size of nanometer particles and the corresponding measuring results are shown. The results obtained through these experimental systems are all compared with the results obtained by instrument of Brookhaven. Mono-disperse and double disperse nanometer particle solutions systems are both studied. The light source is the diode laser with the single transverse mode and its wavelength is 532 nm. It is the avalanche photon diode (APD) instead of the traditional photomultiplier tube (PMT) is selected as the detector for its high quantum efficiency. The scattering light transmits in a closed channel. The experimental systems are designed in two different kinds. The first kind of experimental system is a system without fiber. The second kind of experimental system introduces one fiber for transmission of scattering light. In these two kinds of experimental system, the influences of the polarization state of the incident laser are investigated. The photon counting board is a product of self designed and the dynamic software correlation system is introduced instead of the traditional hardware digital correlator for lower costs. The size of the nanometer particles is computed by the famous CONTIN and NNLS programs.

Citation Download Citation

Shao-yong Deng and Qi Zhang "Experimental studies of PCS system for measuring of nanometer particles", Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751111 (20 November 2009); https://doi.org/10.1117/12.837569

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