Paper
26 October 2009 Spectrum analysis technique for measuring time delay of light in SOI micro-ring slow light device
Di Yang, Yuntao Li, Zhongchao Fan, Xiao Chen, Shai Feng, Min Lv, Yuping Yang
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Abstract
Spectrum analysis technique is introduced to measure the time delay of the silicon-on-insulator (SOI) micro-ring slow light device. The interference spectra of the TE and the TM polarization are obtained based on dual-quadrature spectral interferometry technique. By analyzing the observed spectral interference, the phase and time delay of the output optical pulse of SOI micro-ring is estimated. This method has a very high accuracy of time measurement because it avoids the impact of response speed of optoelectronic device, and moreover, it provides a complete measurement of the complex electric field as a continuous function of frequency.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Di Yang, Yuntao Li, Zhongchao Fan, Xiao Chen, Shai Feng, Min Lv, and Yuping Yang "Spectrum analysis technique for measuring time delay of light in SOI micro-ring slow light device", Proc. SPIE 7516, Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration, 75160S (26 October 2009); https://doi.org/10.1117/12.844918
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Cited by 1 scholarly publication.
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KEYWORDS
Microrings

Polarization

Time metrology

Slow light

Spectrum analysis

Interferometry

Phase measurement

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