Paper
28 December 2010 ECT image reconstruction based on the generalized vector sampled pattern matching method
Yonghong Liu, Yuan Zhao, Yonghui Peng
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75441R (2010) https://doi.org/10.1117/12.885275
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
Electrical capacitance tomography (ECT) is a new technology for testing parameters of solid-air two-phase flow during the past decades. The key technique of ECT is the fast and accurate image reconstruction. In this paper, the principle and measuring process of ECT were elaborated, the reconstruction algorithm called generalized vector sampled pattern matching (GVSPM) method was used in two-phase flow particle concentration visualization. GVSPM method achieves accurate reconstruction by using an objective function that is calculated as the inner product calculation between the experimental capacitance and the reconstructed image capacitance. Mathematica simulation results showed that this method proved superior in the three parameters of capacitance residual, image error and image correlation, compared with the linear back projection (LBP) method. Using the GVSPM method, the "soft-field" effect and the ill-posed inverse problem in ECT technology can be effectively conquered, meanwhile, the reconstructed image has the advantages of high spatial resolution and low distortion.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yonghong Liu, Yuan Zhao, and Yonghui Peng "ECT image reconstruction based on the generalized vector sampled pattern matching method", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441R (28 December 2010); https://doi.org/10.1117/12.885275
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KEYWORDS
Capacitance

Image restoration

Reconstruction algorithms

Electrodes

Image quality

Particles

Inverse problems

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