Non-optically combined multispectral source for IR, visible, and laser testing

Joe LaVeigne; Brian Rich; Steve McHugh; Peter Chua

doi:10.1117/12.850580

22 April 2010 Non-optically combined multispectral source for IR, visible, and laser testing

Joe LaVeigne, Brian Rich, Steve McHugh, Peter Chua

Proceedings Volume 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI; 766214 (2010) https://doi.org/10.1117/12.850580
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

Electro Optical technology continues to advance, incorporating developments in infrared and laser technology into smaller, more tightly-integrated systems that can see and discriminate military targets at ever-increasing distances. New systems incorporate laser illumination and ranging with gated sensors that allow unparalleled vision at a distance. These new capabilities augment existing all-weather performance in the mid-wave infrared (MWIR) and long-wave infrared (LWIR), as well as low light level visible and near infrared (VNIR), giving the user multiple means of looking at targets of interest. There is a need in the test industry to generate imagery in the relevant spectral bands, and to provide temporal stimulus for testing range-gated systems. Santa Barbara Infrared (SBIR) has developed a new means of combining a uniform infrared source with uniform laser and visible sources for electro-optics (EO) testing. The source has been designed to allow laboratory testing of surveillance systems incorporating an infrared imager and a range-gated camera; and for field testing of emerging multi-spectral/fused sensor systems. A description of the source will be presented along with performance data relating to EO testing, including output in pertinent spectral bands, stability and resolution.

Citation Download Citation

Joe LaVeigne, Brian Rich, Steve McHugh, and Peter Chua "Non-optically combined multispectral source for IR, visible, and laser testing", Proc. SPIE 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI, 766214 (22 April 2010); https://doi.org/10.1117/12.850580

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