Grain recognition using local binary patterns variants as texture descriptors

Meizhi Huang; Wenqing Yin; Yan Qian

doi:10.1117/12.886165

4 February 2011 Grain recognition using local binary patterns variants as texture descriptors

Meizhi Huang, Wenqing Yin, Yan Qian

Proceedings Volume 7752, PIAGENG 2010: Photonics and Imaging for Agricultural Engineering; 77520O (2011) https://doi.org/10.1117/12.886165
Event: International Conference on Photonics and Image in Agricultural Engineering (PIAGENG 2010), 2010, Qingdao, China

Abstract

This paper focuses on the use of imaged-based machine learning techniques for identifing grain. In particular we compare several texture descriptors based on Local Binary Patterns(LBP),and we report new experiments using a set of novel texture descriptors based on the combination of the Elongated Quinary Pattern (EQP), the Elongated Ternary Pattern (ELTP) and the Elongated Binary Patterns(ELBP).These three variants of the standard LBP are obtained by considering different shapes for the neighborhood calculation and different encodings for the evaluation of the local gray-scale difference. The resulting extracted features are then used for training a machine-learning classifier(support vector machine). Our results show that a local approach based on the EQP feature extractor, which can express both local and holistic features of the grain image, produces a reliable system for identifing grain.

Citation Download Citation

Meizhi Huang, Wenqing Yin, and Yan Qian "Grain recognition using local binary patterns variants as texture descriptors", Proc. SPIE 7752, PIAGENG 2010: Photonics and Imaging for Agricultural Engineering, 77520O (4 February 2011); https://doi.org/10.1117/12.886165

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KEYWORDS

Feature extraction

Binary data

Computer programming

Image classification

Feature selection

Image processing

Classification systems

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