Rigorous Analysis Of Diffraction By Thin Gratings

Timo Jaaskelainen; Teuvo Hytonen

doi:10.1117/12.967319

1 January 1987 Rigorous Analysis Of Diffraction By Thin Gratings

Timo Jaaskelainen, Teuvo Hytonen

Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967319
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada

Abstract

The most common methods of analyzing diffraction by dielectric gratings are the modal approach and the coupled wave approach, both of which can be exactly formulated. In their rigorous forms these theories are equivalent

Citation Download Citation

Timo Jaaskelainen and Teuvo Hytonen "Rigorous Analysis Of Diffraction By Thin Gratings", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); https://doi.org/10.1117/12.967319

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available