Practical Reduction Of Instrument Signature In Near Specular Light Scatter Measurements

Kyle A. Klicker; John C. Stover; Daniel R. Cheever; Fredrick M. Cady

doi:10.1117/12.967470

1 January 1987 Practical Reduction Of Instrument Signature In Near Specular Light Scatter Measurements

Kyle A. Klicker, John C. Stover, Daniel R. Cheever, Fredrick M. Cady

Proceedings Volume 0818, Current Developments in Optical Engineering II; (1987) https://doi.org/10.1117/12.967470
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

When measuring scattered light as an indication of component quality, the measurement device's own scatter and beam profile limit the minimum angle from specular at which scattered light from the test sample can be measured. The broader the focused specular beam, the more difficult it is to make measurements at low angles. It is of interest to limit system scatter and the instrument's beam profile (signature) when truing to make low angle scatter measurements.

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Kyle A. Klicker, John C. Stover, Daniel R. Cheever, and Fredrick M. Cady "Practical Reduction Of Instrument Signature In Near Specular Light Scatter Measurements", Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); https://doi.org/10.1117/12.967470

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KEYWORDS

Sensors

Mirrors

Scatter measurement

Objectives

Stray light

Optical engineering

Light scattering

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