Paper
17 November 2011 Long distance measurement with submicrometer accuracy
N. Bhattacharya, M. Cui, M. G. Zeitouny, H. P. Urbach, S. A. van den Berg
Author Affiliations +
Proceedings Volume 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 819703 (2011) https://doi.org/10.1117/12.916790
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
The invention of the femto-second frequency comb laser has revolutionized the field of high-resolution spectroscopy, by providing very accurate reference frequencies in the optical domain, acting as a 'frequency ruler'. Similarly, a frequency comb can be viewed as a ruler for distance measurement, which is based on the fact that the vacuum distance between subsequent pulses is known with the accuracy of the used time standard. We have recently demonstrated absolute distance measurements using a FC laser applying a cross-correlation technique, which was supported by a theoretical and a numerical study on the formation of cross-correlation in dispersive media. In this contribution a measurement scheme based on dispersive (spectral) interferometry is presented. For the measurement of distances up to 50 meter, sub-micrometer accuracy is achieved.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. Bhattacharya, M. Cui, M. G. Zeitouny, H. P. Urbach, and S. A. van den Berg "Long distance measurement with submicrometer accuracy", Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 819703 (17 November 2011); https://doi.org/10.1117/12.916790
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KEYWORDS
Distance measurement

Frequency combs

Interferometry

Calibration

Interferometers

Spectroscopy

Helium neon lasers

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