Paper
9 August 1988 A Comparison Between Measured Surface Microtopography And Observed Scattering In The Extreme Ultraviolet
James Green, Sharon Jelinsky, Stuart Bowyer, Roger F. Malina
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Abstract
We present comparative measurements of surface roughness on prepared samples. These measurements have been made with both Talystep profilometers and WYKO interferometers. In addition, we have measured scattering distribution from these samples at extreme ultra-violet wavelengths. The utility of the WYKO interferometer and Talystep device for specifying extreme ultraviolet mirror surface quality is discussed.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Green, Sharon Jelinsky, Stuart Bowyer, and Roger F. Malina "A Comparison Between Measured Surface Microtopography And Observed Scattering In The Extreme Ultraviolet", Proc. SPIE 0830, Grazing Incidence Optics for Astronomical and Laboratory Applications, (9 August 1988); https://doi.org/10.1117/12.942162
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KEYWORDS
Scattering

Light scattering

Extreme ultraviolet

Glasses

Mirrors

Surface roughness

Laser scattering

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