Method of using area CCD to obtain the reflectivity curve

Wenping Guo; Gang Lu; Kecheng Yang; Min Xia; Wei Li; Jie Dai; Xiaohui Zhang

doi:10.1117/12.918736

17 February 2012 Method of using area CCD to obtain the reflectivity curve

Wenping Guo, Gang Lu, Kecheng Yang, Min Xia, Wei Li, Jie Dai, Xiaohui Zhang

Proceedings Volume 8332, Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Sensing and Imaging; 83320W (2012) https://doi.org/10.1117/12.918736
Event: Photonics and Optoelectronics Meetings 2011, 2011, Wuhan, China

Abstract

Reflectivity curve is always used for refractive index measurement. With the help of a mechanical scanning part, conventional method alters the incident angle of a collimated beam to obtain the reflectivity curve, but it has troublesome drawbacks that mechanical scanning is time consuming and would introduce mechanical error. In this paper, a proposed method exploits the reflection characteristic of divergent beam at the critical angle. Its principle using area CCD to obtain the reflectivity curve is demonstrated by simulation. The result shows that the proposed method can instantaneously obtain the reflectivity curve without mechanical errors.

Citation Download Citation

Wenping Guo, Gang Lu, Kecheng Yang, Min Xia, Wei Li, Jie Dai, and Xiaohui Zhang "Method of using area CCD to obtain the reflectivity curve", Proc. SPIE 8332, Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Sensing and Imaging, 83320W (17 February 2012); https://doi.org/10.1117/12.918736

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