Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy

Michael Lo; Craig Prater; Alexandre Dazzi; Roshan Shetty; Kevin Kjoller

doi:10.1117/12.919809

3 May 2012 Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy

Michael Lo, Craig Prater, Alexandre Dazzi, Roshan Shetty, Kevin Kjoller

Author Affiliations +

Proceedings Volume 8373, Micro- and Nanotechnology Sensors, Systems, and Applications IV; 83730L (2012) https://doi.org/10.1117/12.919809
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

Atomic Force Microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument capable of producing sub-micron spatial resolution IR spectra and images. This new capability enables the sprectroscopic characterization of microdomain-forming polymers at levels not previously possible. Films of poly(3-hydroxybutyrate-co-3-hydroxyheanoate) were solution cast on ZnSe prisms. Dramitic differences in the IR spectra are observed in the 1200-1300 cm^-1 range as a funstion of position on a spatial scale of less than one micron. This spectral region is particularly sensitive to the polymer crystallinity, enabling the identification of crystalline and amorphous domains within a single spherulite of this polymer.

Citation Download Citation

Michael Lo, Craig Prater, Alexandre Dazzi, Roshan Shetty, and Kevin Kjoller "Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy", Proc. SPIE 8373, Micro- and Nanotechnology Sensors, Systems, and Applications IV, 83730L (3 May 2012); https://doi.org/10.1117/12.919809

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