Paper
11 September 2012 Two-wavelength whole-field interferometry setup for thermal lens study
Author Affiliations +
Proceedings Volume 8413, Speckle 2012: V International Conference on Speckle Metrology; 841319 (2012) https://doi.org/10.1117/12.978186
Event: SPECKLE 2012: V International Conference on Speckle Metrology, 2012, Vigo, Spain
Abstract
In this paper we present a new approach for thermal lens analysis using a two-wavelength DSPI (Digital Speckle Pattern Interferometry) setup for wavefront sensing. The employed geometry enables the sensor to detect wavefronts with small phase differences and inherent aberrations found in induced lenses. The wavefronts was reconstructed by four-stepping fringe evaluation and branch-cut unwrapping from fringes formed onto a diffusive glass. Real-time single-exposure contour interferograms could be obtained in order to get discernible and low-spacial frequency contour fringes and obtain low-noise measurements. In our experiments we studied the thermal lens effect in a 4% Er-doped CaO-Al2O3 glass sample. The diode lasers were tuned to have a contour interval of around 120 μm. The incident pump power was longitudinally and collinearly oriented with the probe beams. Each interferogram described a spherical-like wavefront. Using the ABCD matrix formalism we obtained the induced lens dioptric power from the thermal effect for different values of absorbed pump power.
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Danilo M. Silva, Eduardo A. Barbosa, and Niklaus U. Wetter "Two-wavelength whole-field interferometry setup for thermal lens study", Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 841319 (11 September 2012); https://doi.org/10.1117/12.978186
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KEYWORDS
Wavefronts

Glasses

Thermal effects

Interferometry

Semiconductor lasers

Speckle pattern

Charge-coupled devices

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