X-ray spectromicroscopy

Alan Michette

doi:10.1117/12.2009660

11 December 2012 X-ray spectromicroscopy

Alan Michette

Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 86780E (2012) https://doi.org/10.1117/12.2009660
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland

Abstract

X-ray spectroscopy is a powerful tool for diagnosing the emission characteristics of X-ray sources. It may also be used in characterizing the elemental and chemical states present in compound materials, including the spatial distribution of these states – spectromicroscopy. This paper describes the appropriate spectroscopic techniques along with examples of their uses – the characterization of laser-plasma sources and the study of chemical state distributions in medium density fibreboard. The possibility of using laboratory-scale sources for spectromicroscopy, as opposed to synchrotrons, are discussed, taking into account the signal to noise ratios that are required to provide the necessary precision.

Citation Download Citation

Alan Michette "X-ray spectromicroscopy", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 86780E (11 December 2012); https://doi.org/10.1117/12.2009660

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