Paper
22 June 2013 Carrier frequency removal in phase measuring deflectometry with non-telecentric imaging
Author Affiliations +
Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87691L (2013) https://doi.org/10.1117/12.2018711
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore
Abstract
In phase measuring deflectometry (PMD), the fringe pattern deformed according to slope deviation of a specular surface is digitized employing a phase-shift technique. Without height-angle ambiguity, carrier-removal process is adopted to evaluate the variation of surface slope from phase distribution when a quasi-plane is measured. This paper investigates nonlinear carrier components introduced by the generalized imaging process in PMD and the nonlinear carrier removal methods. To remove the nonlinear carrier components in PMD, the reference subtraction technique, series-expansion technique and Zernike polynomials which are normally used in fringe projection profilometry are analyzed on accuracy, processing time and experimental simplicity. What’s more, a new nonlinear carrier removal technique is proposed according to the analytical expression of carrier phase. The theoretical analysis and the experiment results show that the new technique is accurate, simple and time-saving.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huimin Yue, Yuxiang Wu, Lei Song, Biyu Zhao, Zhonghua Ou, and Yong Liu "Carrier frequency removal in phase measuring deflectometry with non-telecentric imaging", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87691L (22 June 2013); https://doi.org/10.1117/12.2018711
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KEYWORDS
Fringe analysis

Zernike polynomials

Mirrors

Deflectometry

CCD cameras

Error analysis

LCDs

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