Axis extraction method of symmetry object under unilateral illumination condition in optical measurement images

Shao-wen Ding; Xiao-hui Zhang; Peng-yu Guo; Kun-peng Wang

doi:10.1117/12.2034695

21 August 2013 Axis extraction method of symmetry object under unilateral illumination condition in optical measurement images

Shao-wen Ding, Xiao-hui Zhang, Peng-yu Guo, Kun-peng Wang

Author Affiliations +

Proceedings Volume 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications; 890821 (2013) https://doi.org/10.1117/12.2034695
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

Measuring the three-dimension (3D) orientation parameters of the axis symmetry objects, such as missile and rocket, plays an important role of optimization design and malfunction analysis of the targets in shooting range experimentations. If the target is clear-cut, there are already many ways to extract the axis precisely, and get the three-dimension orientation parameters by triangulation method. But in practical experimentations, we sometimes face the problem that the target is illuminated by intense sunlight, which with the background of sky will cause the imprecision of axis extraction and the increasing of measurement error. To solve the problem, this paper presents an accurate method to extract the target’s axis. The method build a point set, and try to put all the target’s points into it by using the priori-knowledge, such as the symmetry target’s characteristic under unilateral illumination condition, then calculate the regional minimum inertia axis of the set’s points and get the target’s axis. Experimental results show that this method is efficient and robust to noise, which can meet the requirement of unilaterally illuminated target 3D pose interpretation in shooting range.

Citation Download Citation

Shao-wen Ding, Xiao-hui Zhang, Peng-yu Guo, and Kun-peng Wang "Axis extraction method of symmetry object under unilateral illumination condition in optical measurement images", Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 890821 (21 August 2013); https://doi.org/10.1117/12.2034695

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