Paper
7 March 2014 Feedback-induced catastrophic optical mirror damage (COMD) on 976nm broad area single emitters with different AR reflectivity
Britta Leonhäuser, Heiko Kissel, Andreas Unger, Bernd Köhler, Jens Biesenbach
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Abstract
We have carried out a comprehensive study on 976nm single emitters with different AR coatings (1%, 3%, 4%, and 5%), which have been exposed to optical feedback to investigate damages caused by back-reflected light and how to prevent them. By observing the near-field pattern while varying the probe current, we got information about the influence on filamentation and on peak-power densities with and without external optical feedback. For constant feedback strength, filamentation became more pronounced and more dynamic with increasing current. We observed bistable and chaotic “jumping” of high-intensity filaments. For usual operation currents and external feedback strengths of ≥4%, single emitters with low AR coating show COMDs; their positions correlate with excessive peaking in the near-field pattern. Finally we found that an increasing AR reflectivity depletes the influence of feedback light on the near-field pattern as well as on the emission spectra and lowers the risk of COMD.
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Britta Leonhäuser, Heiko Kissel, Andreas Unger, Bernd Köhler, and Jens Biesenbach "Feedback-induced catastrophic optical mirror damage (COMD) on 976nm broad area single emitters with different AR reflectivity", Proc. SPIE 8965, High-Power Diode Laser Technology and Applications XII, 896506 (7 March 2014); https://doi.org/10.1117/12.2039153
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Cited by 18 scholarly publications.
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KEYWORDS
Near field optics

Near field

Diodes

Antireflective coatings

Semiconductor lasers

Reflectivity

Mirrors

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