Single grating phase contrast imaging for x-ray microscopy and microtomography

P. Bruyndonckx; A. Sasov; B. Pauwels

doi:10.1117/12.2061365

12 September 2014 Single grating phase contrast imaging for x-ray microscopy and microtomography

P. Bruyndonckx, A. Sasov, B. Pauwels

Proceedings Volume 9212, Developments in X-Ray Tomography IX; 921204 (2014) https://doi.org/10.1117/12.2061365
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

The grating based approach to phase contrast imaging is rather inefficient in the use of the available x-ray flux due to the presence of two absorption gratings and it requires longer scan times compared to conventional CT because multiple images are needed at each projection angle. To avoid these drawbacks, a proof-of-principle experiment was developed to obtain absorption, phase contrast (DPC) and dark field images (DCI) in a single exposure using only a non-absorbing phase grating, a micro-focus source in cone-beam geometry and a highresolution x-ray detector.

Citation Download Citation

P. Bruyndonckx, A. Sasov, and B. Pauwels "Single grating phase contrast imaging for x-ray microscopy and microtomography", Proc. SPIE 9212, Developments in X-Ray Tomography IX, 921204 (12 September 2014); https://doi.org/10.1117/12.2061365

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