Presentation + Paper
20 August 2015 A new, fast and accurate spectrophotometric method for the determination of the optical constants of arbitrary absorptance thin films from a single transmittance curve: application to dielectric materials
Jean Desforges, Clément Deschamps, Serge Gauvin
Author Affiliations +
Abstract
The determination of the complex refractive index of thin films usually requires the highest accuracy. In this paper, we report on a new and accurate method based on a spectral rectifying process of a single transmittance curve. The agreements with simulated and real experimental data show the helpfulness of the method. The case of materials having arbitrary absorption bands at midpoint in spectral range, such as pigments in guest-host polymers, is also encompassed by this method.
Conference Presentation
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean Desforges, Clément Deschamps, and Serge Gauvin "A new, fast and accurate spectrophotometric method for the determination of the optical constants of arbitrary absorptance thin films from a single transmittance curve: application to dielectric materials", Proc. SPIE 9558, Nanostructured Thin Films VIII, 95580F (20 August 2015); https://doi.org/10.1117/12.2197139
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KEYWORDS
Thin films

Transmittance

Refractive index

Absorption

Dielectrics

Interfaces

Polarization

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