Parametric study of axial trapping forces on an elliptically symmetric dielectric in the ray optics regime

Kristine Faith J. Roque; Giovanni A. Tapang; Caesar A. Saloma

doi:10.1117/12.2196267

29 July 2015 Parametric study of axial trapping forces on an elliptically symmetric dielectric in the ray optics regime

Kristine Faith J. Roque, Giovanni A. Tapang, Caesar A. Saloma

Proceedings Volume 9659, International Conference on Photonics Solutions 2015; 96591M (2015) https://doi.org/10.1117/12.2196267
Event: International Conference on Photonics Solutions 2015, 2015, Hua Hin, Thailand

Abstract

We present the parametric investigation of the axial trapping forces generated by the interaction of an ellipsoidal dielectric and a focused, randomly polarized Gaussian beam in the geometrical optics regime. We show that particle elongation along the optical axis results to a more unstable axial trap compared to that of a reference sphere due to the more positive axial forces for positive axial displacements. Decreasing the refractive index difference between the particle and the surrounding medium (Δn = 0.09) decreases the magnitude of the axial force for positive particle displacements; and for a narrow range of axial displacements an axial trap can be achieved. Increasing the beam wavelength increases the magnitude of the axial force and for 1060 nm an axial trap can be achieved.

Citation Download Citation

Kristine Faith J. Roque, Giovanni A. Tapang, and Caesar A. Saloma "Parametric study of axial trapping forces on an elliptically symmetric dielectric in the ray optics regime", Proc. SPIE 9659, International Conference on Photonics Solutions 2015, 96591M (29 July 2015); https://doi.org/10.1117/12.2196267

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