Paper
27 September 2016 Rapid matching of stereo vision based on fringe projection profilometry
Ruihua Zhang, Yi Xiao, Jian Cao, Hongwei Guo
Author Affiliations +
Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 96840K (2016) https://doi.org/10.1117/12.2243803
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
As the most important core part of stereo vision, there are still many problems to solve in stereo matching technology. For smooth surfaces on which feature points are not easy to extract, this paper adds a projector into stereo vision measurement system based on fringe projection techniques, according to the corresponding point phases which extracted from the left and right camera images are the same, to realize rapid matching of stereo vision. And the mathematical model of measurement system is established and the three-dimensional (3D) surface of the measured object is reconstructed. This measurement method can not only broaden application fields of optical 3D measurement technology, and enrich knowledge achievements in the field of optical 3D measurement, but also provide potential possibility for the commercialized measurement system in practical projects, which has very important scientific research significance and economic value.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ruihua Zhang, Yi Xiao, Jian Cao, and Hongwei Guo "Rapid matching of stereo vision based on fringe projection profilometry", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96840K (27 September 2016); https://doi.org/10.1117/12.2243803
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Cited by 1 scholarly publication.
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KEYWORDS
Cameras

Fringe analysis

Stereo vision systems

3D metrology

Projection systems

3D image processing

Imaging systems

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