Paper
25 October 2016 Third-order optical nonlinearities of TiO2/PS composite system
Mei Xiang, Xiao-yi Lv, Bumaliya Abulimiti, Jun-wei Hou
Author Affiliations +
Proceedings Volume 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices; 96860I (2016) https://doi.org/10.1117/12.2242358
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
A TiO2/PS composite system is prepared by chemical vapor deposition which is a common technique in preparation of nano-materials. We report the measurements of the nonlinear refractive index of the TiO2/PS composite system as measured by the reflection Z-scan technique. The large magnitude of the third-order nonlinear coefficients of the TiO2/PS composite system shows that it is a promising candidate for further material development and possible photonic device applications.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mei Xiang, Xiao-yi Lv, Bumaliya Abulimiti, and Jun-wei Hou "Third-order optical nonlinearities of TiO2/PS composite system", Proc. SPIE 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices, 96860I (25 October 2016); https://doi.org/10.1117/12.2242358
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KEYWORDS
Silicon

Composites

Picosecond phenomena

Reflection

Nonlinear optics

Refractive index

Titanium dioxide

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