Atom-based RF electric field metrology above 100 GHz

Matt T. Simons; Joshua A. Gordon; Christopher L. Holloway

doi:10.1117/12.2213415

25 February 2016 Atom-based RF electric field metrology above 100 GHz

Matt T. Simons, Joshua A. Gordon, Christopher L. Holloway

Proceedings Volume 9747, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX; 97471F (2016) https://doi.org/10.1117/12.2213415
Event: SPIE OPTO, 2016, San Francisco, California, United States

Abstract

Atom-based radio-frequency (RF) electric field probes have the potential to improve electric field measurements for a broad range of frequencies (from a few GHz to 100s of GHz) and field strengths (mV/m to kV/m). For these probes to become a common measurement method, their range must be extended to high frequency (>100 GHz) and low field strength regimes. We present SI-traceable electric field measurements of RF fields above 100 GHz, using Autler-Townes splitting of Rydberg electromagnetically-induced transparency in a rubidium (Rb) vapor. We also demonstrate several techniques, including RF detuning from resonance and enhanced absorption, for increasing the probe sensitivity.

Citation Download Citation

Matt T. Simons, Joshua A. Gordon, and Christopher L. Holloway "Atom-based RF electric field metrology above 100 GHz", Proc. SPIE 9747, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX, 97471F (25 February 2016); https://doi.org/10.1117/12.2213415

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