Spatial Phase Shift Shearography with Multiple Carrier Frequencies

doi:10.1117/3.2235244.ch8

Book: Digital Shearography: New Developments and Applications

Author(s): Lianxiang Yang, Xin Xie

Published: 2016

https://doi.org/10.1117/3.2235244.ch8

Author Affiliations +

Abstract

Chapter 7 introduced the SPS-DS method using a single carrier frequency. With the introduction of a single carrier frequency, the phase map corresponds to a single measurand (either out-of-plane deformation gradient or relative out-of-plane deformation) and can be measured from a single pair of speckle pattern images (before and after/during loading). This chapter will introduce some recent developments in SPS-DS containing multiple carrier frequencies. With multiple carrier frequencies, the SPS-DS system now is capable of measuring multiple measurands simultaneously from a single pair of speckle pattern images.