7 May 2019 Subwavelength interference nanolithography based on metallic–insulator–metallic waveguide with a trapezoid metallic nanoslit coupler
Shuxia Zhang, Xuefeng Yang, Weiyang Yu, Baoji Wang, Xiaolin Cai, Liwei Zhang, Xiaohua Li, Xingtao Jia, Jian Wang, Xiaoxia Zhao
Author Affiliations +
Abstract
A subwavelength interference nanolithography scheme is numerically demonstrated based on a metallic–insulator–metallic waveguide combined with unidirectional couplers. The coupler is a single right-angled (or left-angled) trapezoid metallic nanoslit that can carry out efficient unidirectional generation of surface plasmon polaritons under normal incidence. Simulation results show that a feature size to 50 nm half-pitch uniformity pattern can be obtained at the working wavelength of 365 nm with the proposed scheme. This proposed scheme can enhance the intensity of the interference pattern with higher contrast and field depth and is advantageous for the fabrication process in practical applications.
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 1934-2608/2019/$25.00 © 2019 SPIE
Shuxia Zhang, Xuefeng Yang, Weiyang Yu, Baoji Wang, Xiaolin Cai, Liwei Zhang, Xiaohua Li, Xingtao Jia, Jian Wang, and Xiaoxia Zhao "Subwavelength interference nanolithography based on metallic–insulator–metallic waveguide with a trapezoid metallic nanoslit coupler," Journal of Nanophotonics 13(2), 026006 (7 May 2019). https://doi.org/10.1117/1.JNP.13.026006
Received: 23 January 2019; Accepted: 16 April 2019; Published: 7 May 2019
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Cited by 1 scholarly publication.
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KEYWORDS
Waveguides

Nanolithography

Lithography

Aluminum

Photoresist materials

Wave propagation

Surface plasmon polaritons

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