1 August 1986 Automatic Electron-Beam Deposition Of Multilayer Soft X-Ray Coatings With Laterally Graded D-Spacing
M. P. Bruijn, P. Chakraborty, H. W. van Essen, J. Verhoeven, M. J. van der Wiel
Author Affiliations +
Abstract
A computer-controlled electron-beam evaporation system is described that allows fully automated production of soft x-ray reflection coatings with laterally graded d-spacings. Thickness control is done by a combination of measurement of the evaporation rate with a quadrupole mass spectrometer and measurement of the soft x-ray reflection coefficient on a reference substrate during deposition. Graded thickness is obtained by computer-controlled movement of shutters. A result is given for automatic deposition of a multilayer coating. The first results for deposition of a multilayer soft x-ray coating with linearly varying d-spacing are presented.
M. P. Bruijn, P. Chakraborty, H. W. van Essen, J. Verhoeven, and M. J. van der Wiel "Automatic Electron-Beam Deposition Of Multilayer Soft X-Ray Coatings With Laterally Graded D-Spacing," Optical Engineering 25(8), 258916 (1 August 1986). https://doi.org/10.1117/12.7973930
Published: 1 August 1986
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Cited by 11 scholarly publications.
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KEYWORDS
X-rays

Multilayers

Computing systems

Reflection

Camera shutters

Spectroscopy

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