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1 May 1988 Instrumentation To Measure The Diffuse Thickness Of Scattering Dispersions
Gerald S. Birth, Per-Gunnar Fyhn, Joseph Frank
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Optical Engineering, Vol. 27, Issue 5, 275403 (May 1988). https://doi.org/10.1117/12.7976690
Abstract
An instrument has been developed for measuring the light scattering associated with diffuse reflectance measurements. The instrument measures the sample thickness necessary to bring about diffusion of the transmitted radiation, i.e., the diffuse thickness. This quantity is inversely proportional to the light scattering coefficient as defined by the Kubelka-Munk equations. Results have shown the measurement to be independent of absorption and inversely proportional to particle density in the sample.
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Gerald S. Birth, Per-Gunnar Fyhn, and Joseph Frank "Instrumentation To Measure The Diffuse Thickness Of Scattering Dispersions," Optical Engineering 27(5), 275403 (1 May 1988). https://doi.org/10.1117/12.7976690
Published: 1 May 1988
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KEYWORDS
Light scattering
Scattering
Absorption
Diffuse reflectance spectroscopy
Diffusion
Particles
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