1 January 1990 High density moire interferometry
F. X. Wang, Albert S. Kobayashi
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Abstract
A theoretical background for producing a diffraction grating with line density of 3200 lines/mm for moire interferometry is presented. The utility of this analysis is then demonstrated by producing a 3200 lines/mm grating on a three-point bend beam with an argon ion laser. The possibility of using this procedure with an invisible light source to generate a moire diffraction grating of higher line density is noted.
F. X. Wang and Albert S. Kobayashi "High density moire interferometry," Optical Engineering 29(1), (1 January 1990). https://doi.org/10.1117/12.55566
Published: 1 January 1990
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Diffraction gratings

Deflectometry

Wavefronts

Moire patterns

Fringe analysis

Mirrors

Argon ion lasers

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