Optical Engineering
VOL. 32 · NO. 12 | December 1993
CONTENTS
IN THIS ISSUE

Articles (50)
Articles
Brian Thompson
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.163148
Open Access
TOPICS: Optical engineering, Physics, Roads, Infrared technology, Optics, Positron emission tomography, Materials processing, Atmospheric physics, Atmospheric sensing, Remote sensing
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.163149
Open Access
TOPICS: Remote sensing, Atmospheric sensing, Rockets, Ultraviolet radiation, Spectrographs, Magnetosphere, Imaging systems, Ions, Spectroscopy, Imaging spectroscopy
Bill Sandel, A. Lyle Broadfoot, Roberto Stalio
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149174
TOPICS: Spectrographs, Telescopes, Extreme ultraviolet, Sensors, Plasma, Jupiter, Space telescopes, Ultraviolet radiation, Imaging systems, Stars
Walter Harris, John Clarke, John Caldwell, Paul Feldman, Brett Bush, Daniel Cotton, Supriya Chakrabarti
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149165
TOPICS: Telescopes, Jupiter, Sensors, Spectrographs, Space telescopes, Microchannel plates, Hydrogen, Mirrors, Rockets, Calibration
Jeffrey Baumgardner, Brian Flynn, Michael Mendillo
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149194
TOPICS: Optical filters, Charge-coupled devices, Sensors, Spectrographs, Sodium, Image filtering, Jupiter, Interference filters, Signal to noise ratio, CCD image sensors
Masato Nakamura, Tatsundo Yamamoto, Koichiro Tsuruda, Yoshifumi Saito, Koujun Yamashita, Akihiro Furuzawa, Toshihiro Ogawa, Supriya Chakrabarti
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155625
TOPICS: Extreme ultraviolet, Scanners, Helium, Ions, Extreme ultraviolet lithography, Mars, Microchannel plates, Space operations, Light scattering, Oxygen
William McClintock, George Lawrence, Richard Kohnert, Larry Esposito
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149177
TOPICS: Sensors, Space operations, Saturn, Spectrographs, Telescopes, Space telescopes, Extreme ultraviolet, Optical design, Ultraviolet radiation, Atmospheric modeling
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149171
TOPICS: Sensors, Spectrophotometry, Hydrogen, Scattering, Spectroscopy, Rockets, Mirrors, Airglow, Photometry, Calibration
Andrew Christensen, David Kayser, James Pranke, Paul Straus, David Gutierrez, Supriya Chakrabarti, Robert McCoy, Robert Meier, Kenneth Wolfram, J. Picone
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149189
TOPICS: Extreme ultraviolet, Spectroscopy, Near infrared, Photometry, Sensors, Aerospace engineering, Atmospheric sensing, Atmospheric sciences, Earth's atmosphere, Calibration
Douglas Torr, Marsha Torr, Muamer Zukic, James Spann, R. Barry Johnson
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149175
TOPICS: Charge-coupled devices, Imaging systems, Optical filters, Sensors, Electronics, Ultraviolet radiation, Physics, Spatial resolution, Space operations, Cameras
Muamer Zukic, Douglas Torr, Jongmin Kim, James Spann, Marsha Torr
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149192
TOPICS: Optical filters, Transmittance, Reflection, Image filtering, Reflectivity, Magnesium fluoride, Imaging systems, Refractive index, Physics, Reflectors
Frank Harris, Richard Gattinger, Ian Powell, Ian McDade, Edward Llewellyn, John Yuen, Peter Moorhouse, Supriya Chakrabarti, William Sharp
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149179
TOPICS: Nanoimprint lithography, Airglow, Charge-coupled devices, Rockets, Spectrographs, Gemini Observatory, Imaging systems, Sensors, Spectroscopy, Image resolution
Henry Voss, Joseph Mobilia, Henry Collin, William Imhof
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149181
TOPICS: Ions, Sensors, Chemical species, Satellites, Particles, Spectrometers, Magnetism, Solid state electronics, Electrons, Earth observing sensors
Herbert Funsten III, David McComas, Bruce Barraclough
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149187
TOPICS: Scattering, Carbon, Chemical species, Ions, Sensors, Helium, Aluminum, Hydrogen, Oxygen, Gold
Donald Mitchell, Andrew Cheng, Stamatios Krimigis, Edwin Keath, Stephen Jaskulek, Barry Mauk, Richard McEntire, Edmond Roelof, Donald Williams, Ke Hsieh, Virginia Drake
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155609
TOPICS: Microchannel plates, Particles, Ions, Extreme ultraviolet, Sensors, Chemical species, Magnetosphere, Saturn, Cameras, Signal processing
John Hackwell, David Warren
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149169
TOPICS: Spectrographs, Prisms, Infrared detectors, Sensors, Infrared radiation, Infrared spectroscopy, Staring arrays, Aerospace engineering, Spectral resolution, Interferometers
Daniel Cotton, Supriya Chakrabarti
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149170
TOPICS: Airglow, Interferometers, Extreme ultraviolet, Mirrors, Atmospheric modeling, Sensors, Sun, Monochromators, Oxygen, Spectroscopy
Bill Sandel, A. Lyle Broadfoot
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149186
TOPICS: Spectrographs, Absorption, Sun, Sensors, Ultraviolet radiation, Space operations, Mirrors, Airglow, Charge-coupled devices, Extreme ultraviolet
Howard Ogawa, Donald McMullin, Darrell Judge, Raj Korde
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149195
TOPICS: Spectrometers, Extreme ultraviolet, Photodiodes, Diodes, Quantum efficiency, Diffraction gratings, Calibration, Spectrophotometry, Silicon, Sensors
James Vickers, Daniel Cotton, Timothy Cook, Supriya Chakrabarti
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155597
TOPICS: Ionization, Electrons, Neon, Sensors, Solar energy, Extreme ultraviolet, Microchannel plates, Calibration, Chemical species, Rockets
Yan Betremieux, Timothy Cook, Daniel Cotton, Supriya Chakrabarti
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155603
TOPICS: Imaging spectroscopy, Spectroscopy, Tomography, Reconstruction algorithms, Image processing, Magnetosphere, Sensors, Image restoration, Image resolution, Spectral resolution
Stephen Mende, Stephen Fuselier
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155601
TOPICS: Auroras, Spectroscopy, Spectral resolution, Airglow, Doppler effect, Ultraviolet radiation, Satellites, Remote sensing, Imaging systems, Hydrogen
Daniel Murphy, Yam Chiu
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155148
TOPICS: Ions, Extreme ultraviolet, Scattering, Doppler effect, Magnetosphere, Magnetism, Monte Carlo methods, Oxygen, Radiation effects, Collimation
Michael Hesse, Mark Smith, Federico Herrero, Arthur Ghielmetti, Edward Shelley, Peter Wurz, Peter Bochsler, Dennis Gallagher, Thomas Moore, Thomas Stephen
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155256
TOPICS: Ions, Oxygen, Plasma, Magnetosphere, Chemical species, Space operations, Solar processes, Solar energy, Hydrogen, In situ metrology
Jixiang Yan, Renzhong Zhou, Xin Yu
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149173
TOPICS: Atmospheric modeling, Adaptive optics, Atmospheric optics, Optical engineering, Atmospheric sensing, Remote sensing, Wavefront distortions, Telescopes, Wavefronts, Atmospheric propagation
George Parks, Scott Werden, Michael McCarthy
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.149185
TOPICS: X-rays, Cameras, X-ray imaging, Electrons, Auroras, Spatial resolution, Scintillation, Scintillators, Coded apertures, Knowledge management
Daniel Cotton, Robert Conant, Supriya Chakrabarti
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.155598
TOPICS: Sensors, Telescopes, Mirrors, Imaging systems, Microchannel plates, Magnetosphere, Spherical lenses, Aluminum, Space telescopes, Rockets
Maksymilian Pluta
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.163163
Open Access
TOPICS: Phase contrast, Microscopy, Ocean optics, Digital image correlation, Physics, Visualization, Image analysis, Scientific research, Light sources, Software
Hedzer Ferwerda
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.142941
TOPICS: Phase contrast, Physics, Microscopes, Diffraction gratings, Microscopy, Mechanics, Chemistry, Image acquisition, Modulation, Space telescopes
Maksymilian Pluta
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.148716
TOPICS: Phase contrast, Microscopy, Patents, Microscopes, Optical engineering, Glasses, Physics, Biology, Medical research, Tissues
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.142942
TOPICS: Optical spheres, Imaging systems, Phase shift keying, Visualization, Spatial frequencies, Phase modulation, Phase contrast, Optical imaging, Image processing, Transmittance
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.142943
TOPICS: Image filtering, Optical filters, Optical fibers, Phase contrast, Transmittance, Phase shifts, Microscopy, Visualization, Computer simulations, Image visualization
Maksymilian Pluta
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.148714
TOPICS: Phase contrast, Microscopes, Dielectrics, Microscopy, Glasses, Objectives, Refractive index, Transmittance, Thin films, Prisms
Maksymilian Pluta
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.148713
TOPICS: Polarizers, Phase contrast, Microscopy, Microscopes, Transmittance, Glasses, Phase shifts, Cements, Tungsten, Adaptive optics
Heinz Gundlach
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.142945
TOPICS: Digital image correlation, Microscopy, Ocean optics, Objectives, Microscopes, Phase contrast, Prisms, Optical design, Polarization, Optical microscopy
Miroslawa Bozyk
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.148715
TOPICS: Optical fibers, Phase contrast, Refractive index, Microscopy, Cladding, Phase shifts, Single mode fibers, Liquids, Calibration, Microscopes
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.142946
TOPICS: Crystals, Objectives, Diagnostics, Photodetectors, Polarization, Surface roughness, Scintillation, Interferometers, Measurement devices, Beam splitters
Arun Agarwal
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151286
TOPICS: Sensors, Optical testing, Fiber optics tests, Optical switching, Fiber optics, Waveguides, Reliability, Power meters, Signal attenuation, Laser sources
Shakila Khan, Dong-Ning Qu, Ronald Burge
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151290
TOPICS: Diffraction gratings, Diffraction, Spherical lenses, Polarization, Microwave radiation, Backscatter, Far-field diffraction, Scattering, Electromagnetism, Multiple scattering
Anthony Tai, Michael Eismann, Bradley Neagle
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151288
TOPICS: Holography, Holograms, Receivers, Diffraction, Glasses, Computer generated holography, Optical design, Spherical lenses, Lens design, Detector arrays
Jim Freeze, Richard Selfridge
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151282
TOPICS: Diffraction gratings, Photoresist materials, Cladding, Etching, Holography, Silica, Wet etching, Mirrors, Water, Structured optical fibers
Mukund Acharya, Robert Bunch, Richard Hertel
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151284
TOPICS: Image intensifiers, Near field, Microchannel plates, Fiber optics, Quartz, Fiber optics tests, Light scattering, Near field optics, Stray light, Optical testing
Paul Whelan, Bruce Batchelor
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151281
TOPICS: Databases, Visualization, Image processing, Manufacturing, Molybdenum, Machine vision, Hough transforms, Image enhancement, Electronics engineering, Systems engineering
Ron Atkinson, Ian Salter, Jiansheng Xu
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151271
TOPICS: Magneto-optics, Reflectivity, Signal to noise ratio, Magnetism, Mirrors, Kerr effect, Aluminum, Refractive index, Promethium, Interference (communication)
Jacques Verly, Richard Delanoy
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151299
TOPICS: Selenium, Mathematical morphology, Image processing, Binary data, Sensors, Shape analysis, Digital imaging, Computing systems, Solids, Optical sensors
Jeffrey Sloan, Donald Small
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151291
TOPICS: Optical correlators, Prisms, Optical filters, Fourier transforms, Missiles, Light valves, Semiconductor lasers, Spatial light modulators, Telescopes, Video
J. Mayer
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151296
TOPICS: Beam splitters, Mirrors, Optical isolators, Retroreflectors, Polarization, Sensors, Photodetectors, Optical design, Safety, Wave plates
Ulf Persson
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151303
TOPICS: Speckle, Speckle pattern, Surface roughness, Light scattering, Radium, Cameras, Video, Scattering, Visible radiation, Infrared radiation
Dorian Minkov, Ryno Swanepoel
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/12.151287
TOPICS: Refractive index, Thin films, Reflection, Dielectrics, Systems modeling, Absorption, Quartz, Computing systems, Dielectric polarization, Thin film deposition
Optical Engineering, Vol. 32, Issue 12, (December 1993) https://doi.org/10.1117/1.OE.32.12.bkrvw1
Open Access
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