Editorial
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1591196
Open Access
OE Letters
Ju-Seog Jang, Bahram Javidi
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1584054
TOPICS: 3D image processing, 3D displays, Image processing, Integral imaging, Image resolution, LCDs, 3D image reconstruction, Image display, Computing systems, Imaging systems
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1584055
TOPICS: Multiplexing, Holograms, Tolerancing, Crystals, Diffraction, Interfaces, Computer programming, Diffusers, Spherical lenses, Volume holography
ASTROMETRY
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1576405
TOPICS: Interferometers, Stars, Lab on a chip, Metrology, Error analysis, Interferometry, Space operations, Optical engineering, Instrument modeling, Telescopes
CONCENTRATION MEASUREMENTS
Kun-Huang Chen, Cheng-Chih Hsu, Der-Chin Su
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1577115
TOPICS: Interferometry, Heterodyning, Surface plasmons, Bioalcohols, Thin films, Glucose, Metals, Refractive index, Phase measurement, Reflection
DEFLECTION MEASUREMENTS
Alexandar Djordjevich
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1576404
TOPICS: Sensors, Optical fibers, Structured optical fibers, Composites, Ray tracing, Measurement devices, Modulation, Coating, Optical engineering, Signal processing
FIBER CHARACTERIZATION
Shane Huntington, Ann Roberts, Keith Nugent, Simon Fleming
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1576221
TOPICS: Near field scanning optical microscopy, Etching, Structured optical fibers, Refractive index, Atomic force microscopy, Solids, Optical fibers, Spatial resolution, Scanning probe microscopy, Photonics
Jabulani Dhliwayo, Aiyu Zhang, Rahim Nathoo
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1580154
TOPICS: Birefringence, Polarization, Polarimetry, Lead, Measurement devices, Matrices, Jones matrices, Wave plates, Polarizers, Dispersion
FIBER GRATINGS
Hai-Han Lu, Wen-Shing Tsai, Wen-Jen Wang, Hsu-Hung Huang
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1577577
TOPICS: Wavelength division multiplexing, Modulation, Composites, Channel projecting optics, Polarization, Single mode fibers, Dense wavelength division multiplexing, Complex systems, Nonlinear optics, Optical amplifiers
Kin Chiang, Ramesh Kancheti, Vipul Rastogi
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1576533
TOPICS: Sensors, Magnetic sensors, Fiber Bragg gratings, Magnetism, Temperature metrology, Magnetostrictive materials, Head, Fiber optics sensors, Metals, Spectrum analysis
Tsung-Yi Tang, Paoyi Tseng, Chung-Yi Chiu, Chih Chung Yang, Yean-Woei Kiang, Kung-Jen Ma
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578647
TOPICS: Cladding, Optical filters, Refractive index, Structured optical fibers, Optical engineering, Fiber couplers, Wave propagation, Copper, Glasses, Phase matching
FOCAL PLANE ARRAYS
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579490
TOPICS: Principal component analysis, Calibration, Staring arrays, Sensors, Fourier transforms, Cameras, Infrared cameras, Interference (communication), Infrared imaging, Time metrology
Gurcan Buyuksalih
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579032
TOPICS: Imaging systems, Calibration, Scanners, CCD cameras, Cameras, Infrared imaging, Infrared radiation, Infrared cameras, Video, Sensors
FRINGE PROJECTION
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1580833
TOPICS: Feature extraction, 3D image processing, Fringe analysis, Volume rendering, Imaging systems, Cameras, 3D displays, Data acquisition, Modulation, Image acquisition
IMAGE CODING
Hisakazu Kikuchi, Hiroto Sato, Satoshi Hasebe, Naoki Mizutani, Shogo Muramatsu, Shigenobu Sasaki, Jie Zhou, Seishi Sekine, Yoshito Abe, Ikuo Tofukuji, Makoto Nakashizuka
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578492
TOPICS: CRTs, Color difference, Computer programming, RGB color model, Optical engineering, Associative arrays, Quantization, Cameras, Visualization, Chest
DianLong Liang, Lizhi Cheng, Zenghui Zhang
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1580153
TOPICS: Wavelets, Image compression, Image quality, Image filtering, Wavelet transforms, Field programmable gate arrays, Binary data, Optical engineering, Optical filters, Linear filtering
IMAGE COMPRESSION
Shen-Chuan Tai, Yen-Yu Chen, Wen-Chien Yan
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578645
TOPICS: Image compression, Medical imaging, JPEG2000, Wavelets, Quantization, Computer programming, Optical engineering, Reconstruction algorithms, Angiography, Algorithms
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1576776
TOPICS: Image segmentation, Image quality, Image compression, Quantization, Image processing, Computer programming, Visualization, Optical engineering, Image restoration, Digital imaging
IMAGE SEGMENTATION
Vianney Le Thuc, Abdelmalik Taleb-Ahmed, Xavier Leclerc, T. Saint Michel
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1580832
TOPICS: Brain, Image segmentation, Magnetic resonance imaging, Neuroimaging, Head, Expectation maximization algorithms, Tissues, Image processing algorithms and systems, Image processing, Optical engineering
INFRARED PHOTODETECTORS
Baojun Li, Soojin Chua, Eugene Fitzgerald
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578085
Integrated Optics
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578084
TOPICS: Antennas, K band, Picosecond phenomena, Phased array optics, Microwave radiation, Holography, Waveguides, Signal detection, Photodetectors, Phased arrays
Interferometry
Yueguang Lu, Andrew Doel, David Walker, Xia Zhao
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579489
TOPICS: Phase shifts, Sensors, Mirrors, Phase interferometry, Charge-coupled devices, Retroreflectors, Error analysis, Phase shift keying, Modulation, Data processing
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579702
TOPICS: Modulation, Nondestructive evaluation, Speckle pattern, Interferometry, Phase shifts, Speckle, Digital cameras, Aluminum, Phase shifting, Phase shift keying
LASER COMMUNICATION
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579491
TOPICS: Antennas, Receivers, Telecommunications, Transmitters, Satellites, Interference (communication), Phased array optics, Optical communications, Error analysis, Fourier transforms
LASER DOPPLER VELOCIMETERS
J. Skeivalas, V. Giniotis
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1577579
TOPICS: Doppler effect, Error analysis, Velocity measurements, Laser stabilization, Diffraction, Mercury, Atmospheric propagation engineering, Radio propagation, Electromagnetic radiation, Atmospheric propagation
LENS CORRECTION
Jie Jiang, Guangjun Zhang, Fuqiang Zhou, Daoyin Yu, Hongbo Xie, Hang Liu
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1580155
TOPICS: Distortion, Calibration, Field programmable gate arrays, Endoscopes, Digital image processing, Optical engineering, Video, Distributed interactive simulations, Mathematical modeling, Cameras
LIGHT SCATTERING
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578086
TOPICS: Radiative transfer, Scattering, Probability theory, Absorption, Optical properties, Reflectivity, Light scattering, Polarization, Optical engineering, Particles
LIQUID CRYSTAL DISPLAYS
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579492
TOPICS: Transmittance, LCDs, Polarization, Polarizers, Optical spheres, Liquid crystals, Electronics engineering, Optical modulators, Atrial fibrillation, Optical alignment
MICROSCOPY
Katrina Mikhaylich, V. Yakovlev
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578493
TOPICS: Semiconducting wafers, Luminescence, Confocal microscopy, Microscopy, Silicon, Image resolution, Spatial resolution, Microscopes, Reflection, Semiconductors
NIGHT VISION
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578491
TOPICS: Visualization, Night vision goggles, Objectives, Imaging systems, Night vision systems, Atmospheric sensing, Night vision, Target detection, Reflectivity, Goggles
OPTICAL CORRELATORS
Joaquim Barbe, Juan Campos, Josep Nicolas, Claudio Iemmi
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1580156
TOPICS: Image filtering, Optical correlators, Image classification, Optical filters, Spatial light modulators, Filtering (signal processing), Linear filtering, Signal processing, Phase only filters, Wave plates
Optical Interconnects
S. Yeh, Y. Shen
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579019
TOPICS: Diffraction, Diffraction gratings, Optical components, Optical matrix switches, Optical interconnects, Reflectivity, Microlens, Optical engineering, Spatial light modulators, Photoresist materials
SPATIAL LIGHT MODULATORS
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579705
TOPICS: Optically addressed spatial light modulators, Mirrors, Diffraction, Diffraction gratings, Spatial frequencies, Binary data, Polarizers, Modulation, Aluminum, Signal processing
STEGANOGRAPHY
Hua Zhong, Licheng Jiao, Fang Liu
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1577351
TOPICS: Image processing, Steganography, Steganalysis, Image quality, Optical engineering, Statistical modeling, Receivers, Modulation, Data hiding, Statistical analysis
STEREOGRAPHY
Osami Sasaki, Kenichi Sakata, Takamasa Suzuki
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1577576
TOPICS: LCDs, Distance measurement, Binary data, Cameras, Image resolution, Edge detection, Wave propagation, Image processing, Optical engineering, Optical components
STEREOLITHOGRAPHY
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579704
TOPICS: Solids, Manufacturing, Stereolithography, Signal attenuation, 3D modeling, Laser scanners, Data modeling, Glasses, Optical engineering, Laser irradiation
SYNTHETIC APERTURE RADAR
Ronald Driggers, James Ratches, Jon Leachtenauer, Regina Kistner
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1580831
TOPICS: Radar, Synthetic aperture radar, Sensors, Target acquisition, Infrared imaging, Visible radiation, Electro optical modeling, Performance modeling, Systems modeling, Target recognition
Fred Dickey, Louis Romero, Armin Doerry
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1578646
TOPICS: Synthetic aperture radar, Radar, Radar imaging, Optical engineering, Image processing, Fourier transforms, Picosecond phenomena, Imaging systems, Algorithm development, Image resolution
TARGET DETECTION
Chen-Pang Yeang, Choongyeun Cho, Jeffrey Shapiro
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579031
TOPICS: Reflectors, Target detection, Radar, Synthetic aperture radar, Sensors, Polarimetry, Target recognition, Scattering, Signal processing, Receivers
WAVELENGTH DIVISION MULTIPLEXING NETWORKS
Min Rao, Xiaohan Sun, Mingde Zhang
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1577578
TOPICS: Homodyne detection, Artificial intelligence, Switches, Monte Carlo methods, Wavelength division multiplexing networks, Interference (communication), Optical switching, Sun, Wavelength division multiplexing, Receivers
XENON ARC LAMPS
Ron Ferrante, Michael Fulton, Robert Cabrera, James Walker, Holger Claus
Optical Engineering, Vol. 42, Issue 07, (July 2003) https://doi.org/10.1117/1.1579703
TOPICS: Metals, Lamps, Optical filters, Xenon, Linear filtering, Dielectric filters, Reflectivity, Thin films, Thin film coatings, Dielectrics
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