Simultaneous one-shot profilometry and gamma correction

César Augusto García-Isáis; Noé Alcalá Ochoa; Javier Cruz-Salgado

doi:10.1117/1.OE.58.3.034104

9 March 2019 Simultaneous one-shot profilometry and gamma correction

César Augusto García-Isáis, Noé Alcalá Ochoa, Javier Cruz-Salgado

Author Affiliations +

Optical Engineering, Vol. 58, Issue 3, 034104 (March 2019). https://doi.org/10.1117/1.OE.58.3.034104

Abstract

We propose a method to correct the nonlinearities introduced by the projector and camera system in one-shot fringes projection profilometry. It is shown that the gamma value can be calculated with high precision employing Fourier techniques. Fourier and phase shifting phase extraction experiments are carried out to show the applicability of the method.

Citation Download Citation

César Augusto García-Isáis, Noé Alcalá Ochoa, and Javier Cruz-Salgado "Simultaneous one-shot profilometry and gamma correction," Optical Engineering 58(3), 034104 (9 March 2019). https://doi.org/10.1117/1.OE.58.3.034104

Received: 11 December 2018; Accepted: 25 February 2019; Published: 9 March 2019

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