Dr. Bradley N. Damazo Profile

Dr. Bradley N. Damazo

Mechanical Engineer at National Institute of Standards and Technology

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Publications (7)

Proceedings Article | 2 December 2014 Open Access

Introduction to special session on microscopy for Science, Technology, Engineering and Math (STEM) educators

Michael Postek, Mary Satterfield, Bradley Damazo, Robert Gordon

Proceedings Volume 8378, 837817 (2014) https://doi.org/10.1117/12.2183085

KEYWORDS: Scanning transmission electron microscopy, Microscopy, Scanning electron microscopy, Mathematics, Electron microscopes, Photomicroscopy, Nanotechnology, Microscopes, Outreach programs, Standards development

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Proceedings Article | 6 April 2012 Paper

Nanoparticle size and shape evaluation using the TSOM method

Bradley Damazo, Ravikiran Attota, Purushotham Kavuri, András Vladár

Proceedings Volume 8324, 832436 (2012) https://doi.org/10.1117/12.918263

KEYWORDS: Nanoparticles, Particles, Gold, Scanning electron microscopy, Optical microscopes, Silicon, Optical microscopy, Calibration, Image processing, Quartz

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Proceedings Article | 24 May 2004 Paper

Laser sample stage-based image resolution enhancement method for SEMs

András Vladar, Eranga Jayewardene, Bradley Damazo, William Keery, Michael Postek

Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.562367

KEYWORDS: Scanning electron microscopy, Image resolution, Image enhancement, Electron beams, Resolution enhancement technologies, Line scan image sensors, Interferometers, Standards development, Electron microscopes, Electronics

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Proceedings Article | 24 May 2004 Paper

New method for the measurement of SEM stage vibrations

Bradley Damazo, Eranga Jayewardene, Andras Vladar, William Keery, Michael Postek

Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.537502

KEYWORDS: Scanning electron microscopy, Interferometers, Metrology, Control systems, Calibration, Motion measurement, Electron beams, Control systems design, Standards development, Laser systems engineering

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SPIE Journal Paper | 1 January 2004

Atomic-resolution measurements with a new tunable diode laser-based interferometer

Richard Silver, H. Zou, Satoshi Gonda, Bradley Damazo, Jau-Shi Jun, Carsten Jensen, Lowell Howard

OE, Vol. 43, Issue 01, (January 2004) https://doi.org/10.1117/12.10.1117/1.1631002

KEYWORDS: Semiconductor lasers, Scanning tunneling microscopy, Interferometers, Mirrors, Data acquisition, Tunable diode lasers, Polarization, Motion measurement, Crystals, Distance measurement

Proceedings Article | 16 July 2002 Paper

Design and development of a measurement and control system for measuring SEM magnification calibration samples

Bradley Damazo, E. Jayewardene, William Keery, Andras Vladar, Michael Postek

Proceedings Volume 4689, (2002) https://doi.org/10.1117/12.473445

KEYWORDS: Scanning electron microscopy, Control systems design, Control systems, Calibration, Interferometers, Standards development, Metrology, Motion measurement, LabVIEW, Electron beams

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Proceedings Article | 22 August 2001 Paper

SEM sentinel-SEM performance measurement system

Bradley Damazo, Andras Vladar, Alice Ling, M. Alkan Donmez, Michael Postek, E. Jayewardene

Proceedings Volume 4344, (2001) https://doi.org/10.1117/12.436805

KEYWORDS: Scanning electron microscopy, Semiconducting wafers, Electron beams, Protactinium, Standards development, Wafer manufacturing, Image quality, Interfaces, Image quality standards, Telecommunications

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Showing 5 of 7 publications

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