Dr. David K. MacKinnon
Patent Examiner
SPIE Involvement:
Author
Area of Expertise:
dimesnional metrology , 3D imaging , laser range scanners
Publications (9)

Proceedings Article | 21 June 2015 Paper
Proceedings Volume 9528, 95280R (2015) https://doi.org/10.1117/12.2179591
KEYWORDS: Imaging systems, Error analysis, Signal detection, Distance measurement, Ranging, Modulation, Phase shift keying, Beam shaping, Standards development, Stereoscopy

SPIE Journal Paper | 12 March 2012
David MacKinnon, Jean-Angelo Beraldin, Luc Cournoyer, Michel Picard, Francois Blais
OE, Vol. 51, Issue 02, 021111, (March 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.2.021111
KEYWORDS: Imaging systems, Image resolution, Stereoscopy, 3D image processing, 3D modeling, Sensors, Spatial resolution, Laser systems engineering, Systems modeling, Optical engineering

Proceedings Article | 27 January 2011 Paper
Proceedings Volume 7864, 786402 (2011) https://doi.org/10.1117/12.872124
KEYWORDS: Chromium, Imaging systems, Optical spheres, Error analysis, Stereoscopy, Dimensional metrology, Calibration, Metrology, Spherical lenses, Tolerancing

Proceedings Article | 27 January 2011 Paper
Proceedings Volume 7864, 78640L (2011) https://doi.org/10.1117/12.871942
KEYWORDS: Optical spheres, Imaging systems, Calibration, Stereoscopy, Distance measurement, Standards development, Tolerancing, Optical properties, Manufacturing, Algorithm development

SPIE Journal Paper | 1 January 2010
JEI, Vol. 19, Issue 01, 011004, (January 2010) https://doi.org/10.1117/12.10.1117/1.3267094
KEYWORDS: Image quality, Quality measurement, Laser range finders, Reflectivity, Composites, Scanners, Data processing, Image processing, Solid modeling, Signal detection

Showing 5 of 9 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top